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Simple Method to Determine the Rotation Between a TEM Image and Diffraction Pattern
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 782-783
- Print publication:
- August 2022
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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 13 December 2016, pp. 936-946
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- 14 March 2017
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X-ray diffraction peak-broadening analysis of (La-M)2CuO4 high-Tc superconductors
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- Journal:
- Powder Diffraction / Volume 8 / Issue 1 / March 1993
- Published online by Cambridge University Press:
- 10 January 2013, pp. 2-6
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Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1184 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1184-HH01-08
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- 2009
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Thermodynamic Modeling of Island Size Distributions for InGaAs/GaAs Self Assembled Quantum Dots: A Quantitative Effort to Understand Ensemble Size Nonuniformity
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- Journal:
- MRS Online Proceedings Library Archive / Volume 959 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0959-M14-04
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- 2006
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Investigation of the Shape of InGaAs/GaAs Quantum Dots
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- Journal:
- MRS Online Proceedings Library Archive / Volume 737 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, E13.40
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- 2002
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Growth of Laser Ablated YBa2Cu3O7−δ Films as Examined by Rheed and Scanning Tunneling Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 285 / 1992
- Published online by Cambridge University Press:
- 01 January 1992, 305
- Print publication:
- 1992
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Grain Boundary Segregation and Thermal History Effects on Properties of La1.85Sr0.15CuO4-y Superconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 99 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 821
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- 1987
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